wave-scan dual

Appearance control is no longer limited to final topcoat inspection. Thus, the surface quality after each paint process step can be objectively evaluated. With wave-scan dual, there is no more guessing which substrate layer is influencing the final appearance. The instrument helps you objectively analyse appearance problems and reduces time spent trouble shooting.

 

Features include:

  • For flat and curved surfaces (radius larger than 50 cm)
  • Classical LW, SW and customer specific scale
  • Structure spectrum to analyse appearance changes for optimisation
  • Dullness and DOI measurement independent of the paint system
  • Easy scroll wheel operation and large, multilingual display
  • Scales and scan lengths can be selected from menu
  • Full statistics and data saving
  • Docking station for data transfer to the PC and recharging the batteries of the Orange Peel meter
  • Smart-chart software for data analysis and documentation

Download technical data sheet

 

 

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